AFM Vibrational - Static Modes
Surface topography is scanned by using TT2 - AFM Workshop Atomic Force Microscopy. Surface defects, roughness, grains and lithographic patterns are measured in high resolution. DNA, nanoparticles and nanotubes can be monitorized. Maximum scanning area: 50 x 50 µm. Minimum scanning area: 1 x 1 µm.
Magnetic Force Microscopy, MFM
Magnetic topography of surface is scanned by using magnetic mode of TT2 - AFM Workshop Atomic Force Microscopy. Images of magnetic fields associated with small domains is generated. Magnetic fields associated with individual magnetic nanoparticles can also be revealed through MFM.
AFM (Atomic Force Microscopy) Measurement Fees | |||
Item | Quantity* | Price | Price for Foreign Countries |
AFM-Vibrational Mode | 1 | 600,00 ₺ | 100,00 € |
AFM-Static Mode | 1 | 600,00 ₺ | 100,00 € |
Magnetic Force Microscopy, MFM | 1 | 1000,00 ₺ | 175,00 € |
* The price is requested for first measurement of a sample. 50% discount is offered for further measurement of the sample.
VAT is not included in prices above.
This page updated by Physics on 28.03.2023 18:41:05