Nanotechnology R&D Laboratory AFM Measurements
AFM Vibrational - Static Modes
Surface topography is scanned by using TT2 - AFM Workshop Atomic Force Microscopy. Surface defects, roughness, grains and lithographic patterns are measured in high resolution. DNA, nanoparticles and nanotubes can be monitorized. Maximum scanning area: 50 x 50 µm. Minimum scanning area: 1 x 1 µm.
Magnetic Force Microscopy, MFM
Magnetic topography of surface is scanned by using magnetic mode of TT2 - AFM Workshop Atomic Force Microscopy. Images of magnetic fields associated with small domains is generated. Magnetic fields associated with individual magnetic nanoparticles can also be revealed through MFM.
|AFM (Atomic Force Microscopy) Measurement Fees|
|Item||Quantity*||Price||Price for Foreign Countries|
|AFM-Vibrational Mode||1||300,00 ₺||100,00 €|
|AFM-Static Mode||1||300,00 ₺||100,00 €|
|Magnetic Force Microscopy, MFM||1||500,00 ₺||175,00 €|
* The price is requested for first measurement of a sample. 50% discount is offered for further measurement of the sample.
VAT is not included in prices above.